Optical magnetic field enhancement using ultrafast azimuthally polarized laser beams and tailored metallic nanoantennas

Rodrigo Martín-Hernández; Lorenz Grünewald; Luis Sánchez-Tejerina; Luis Plaja; Enrique Conejero Jarque; Carlos Hernández-García; Sebastian Mai

doi:10.1364/PRJ.511916

Photonics Research, Volume. 12, Issue 5, 1078(2024)

Optical magnetic field enhancement using ultrafast azimuthally polarized laser beams and tailored metallic nanoantennas Editors' Pick

Rodrigo Martín-Hernández^1,2、†, Lorenz Grünewald^3,4、†, Luis Sánchez-Tejerina^1,5, Luis Plaja^1,2, Enrique Conejero Jarque^1,2, Carlos Hernández-García^1,2,6、*, and Sebastian Mai^3,7、*

Author Affiliations

¹Grupo de Investigación en Aplicaciones del Láser y Fotónica, Departamento de Física Aplicada, Universidad de Salamanca, E-37008 Salamanca, Spain

²Unidad de Excelencia en Luz y Materia Estructuradas (LUMES), Universidad de Salamanca, E-37008 Salamanca, Spain

³Institute of Theoretical Chemistry, Faculty of Chemistry, University of Vienna, 1090 Vienna, Austria

⁴Vienna Doctoral School in Chemistry (DoSChem), Faculty of Chemistry, University of Vienna, 1090 Vienna, Austria

⁵Departamento de Electricidad y Electrónica, Universidad de Valladolid, 47011 Valladolid, Spain

⁶e-mail: carloshergar@usal.es

⁷e-mail: sebastian.mai@univie.ac.at

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Rodrigo Martín-Hernández, Lorenz Grünewald, Luis Sánchez-Tejerina, Luis Plaja, Enrique Conejero Jarque, Carlos Hernández-García, Sebastian Mai, "Optical magnetic field enhancement using ultrafast azimuthally polarized laser beams and tailored metallic nanoantennas," Photonics Res. 12, 1078 (2024)

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Paper Information

Category: Nanophotonics and Photonic Crystals

Received: Nov. 13, 2023

Accepted: Feb. 14, 2024

Published Online: May. 7, 2024

The Author Email: Carlos Hernández-García (carloshergar@usal.es), Sebastian Mai (sebastian.mai@univie.ac.at)

DOI:10.1364/PRJ.511916

CSTR:32188.14.PRJ.511916

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology