Acta Optica Sinica, Volume. 2, Issue 1, 79(1982)
A reticle method for exactly measuring Gaussian optical spot parameter
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XU SHENLONG, YIN DAREN. A reticle method for exactly measuring Gaussian optical spot parameter[J]. Acta Optica Sinica, 1982, 2(1): 79
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Jan. 9, 1981
Accepted: --
Published Online: Sep. 15, 2011
The Author Email:
CSTR:32186.14.
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