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Laser & Optoelectronics Progress, Volume. 55, Issue 5, 053103(2018)

Influence of Defect Modes of Metal Films on Filtering Characteristics of One-dimensional Photonic Crystals

Yuanyuan Liu1、1; , Xufeng Li1、1; , Yali Zhao1、2; , Wei Peng1、3; , and Wen Yang1、1;
Author Affiliations
  • 1 No.33 Research Institute of China Electronics Technology Group Corporation, Taiyuan, Shanxi 0 30024, China
  • 1 School of Applied Science, Taiyuan University of Science and Technology, Taiyuan, Shanxi 0 30024, China
  • 1 School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian, Liaoning 116024, China
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    AbstractGet PDF(in Chinese)
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    Structure of 1D photonic crystal with defects

    Fig. 1. Structure of 1D photonic crystal with defects

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    (a) Transmissivity distribution; (b) transmission spectrum at dc=50 nm

    Fig. 2. (a) Transmissivity distribution; (b) transmission spectrum at dc=50 nm

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    Dispersion curves of photonic crystal under different conditions. (a) dc=20 nm; (b) dc=50 nm; (c) dc=80 nm

    Fig. 3. Dispersion curves of photonic crystal under different conditions. (a) dc=20 nm; (b) dc=50 nm; (c) dc=80 nm

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    Transmissivity of photonic crystal versus incident wavelength under different incident angles

    Fig. 4. Transmissivity of photonic crystal versus incident wavelength under different incident angles

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    (a) Effect of ITO film thickness on transmissivity of photonic crystal; (b) relationship between transmissivity and ITO film thickness at 400 nm wavelength

    Fig. 5. (a) Effect of ITO film thickness on transmissivity of photonic crystal; (b) relationship between transmissivity and ITO film thickness at 400 nm wavelength

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    Yuanyuan Liu, Xufeng Li, Yali Zhao, Wei Peng, Wen Yang. Influence of Defect Modes of Metal Films on Filtering Characteristics of One-dimensional Photonic Crystals[J]. Laser & Optoelectronics Progress, 2018, 55(5): 053103

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    Paper Information

    Category: Thin films

    Received: Nov. 14, 2017

    Accepted: --

    Published Online: Sep. 11, 2018

    The Author Email: Xufeng Li (xfli@mail.dlu)

    DOI:10.3788/LOP55.053103

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology