Laser & Optoelectronics Progress, Volume. 58, Issue 8, 0810016(2021)
Simulation Study on Ion Beam Polishing with Changing Aperture by Diaphragm Method
Fig. 2. Ion beam removal function model of diaphragm in different apertures. (a) 5 mm; (b) 8 mm; (c) 12 mm; (d) 16 mm
Fig. 3. Simulation results of ion beam one-dimensional superposition with 16 mm diaphragm. (a) Superimposed effect; (b) volatility
Fig. 6. Optimal surface shapes of 16 mm aperture with different number of optimizations. (a) Preliminary simulation; (b) 1st optimization; (c) 2nd optimization; (d) 3rd optimization
Fig. 7. Root mean square values of diaphragm at different apertures. (a) 12 mm; (b) 8 mm; (c) 5 mm
Fig. 8. Ion beam simulation surface residual of diaphragm at different apertures. (a) 16 mm; (b) 12 mm; (c) 8 mm; (d) 5 mm
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Le Kang, Shilei Jiang, Guobin Sun, Yuhao Zhang, Weiguo Liu. Simulation Study on Ion Beam Polishing with Changing Aperture by Diaphragm Method[J]. Laser & Optoelectronics Progress, 2021, 58(8): 0810016
Category: Image Processing
Received: Aug. 7, 2020
Accepted: Sep. 14, 2020
Published Online: Apr. 16, 2021
The Author Email: Shilei Jiang (jiangshilei8@163.com)