Laser & Optoelectronics Progress, Volume. 58, Issue 8, 0810016(2021)

Simulation Study on Ion Beam Polishing with Changing Aperture by Diaphragm Method

Le Kang, Shilei Jiang*, Guobin Sun, Yuhao Zhang, and Weiguo Liu
Author Affiliations
  • School of Optoelectronic Engineering, Xi'an Technological University, Xi'an, Shaanxi 710021, China
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    Figures & Tables(13)
    Diaphragms of different apertures. (a) 16 mm;(b) 12 mm;(c) 8 mm;(d) 5 mm
    Ion beam removal function model of diaphragm in different apertures. (a) 5 mm; (b) 8 mm; (c) 12 mm; (d) 16 mm
    Simulation results of ion beam one-dimensional superposition with 16 mm diaphragm. (a) Superimposed effect; (b) volatility
    Initial profile of fused quartz sample with diameter of 120 mm
    Ion beam simulation of residual variation curves with 16 mm aperture
    Optimal surface shapes of 16 mm aperture with different number of optimizations. (a) Preliminary simulation; (b) 1st optimization; (c) 2nd optimization; (d) 3rd optimization
    Root mean square values of diaphragm at different apertures. (a) 12 mm; (b) 8 mm; (c) 5 mm
    Ion beam simulation surface residual of diaphragm at different apertures. (a) 16 mm; (b) 12 mm; (c) 8 mm; (d) 5 mm
    Residence time distribution
    Surface shape after processing
    • Table 1. Removal characteristic parameters of diaphragm in different apertures

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      Table 1. Removal characteristic parameters of diaphragm in different apertures

      Target distance/mmAperture/mmRemoval characteristic
      FWHM/mmσ/mmMaximum removal rate/(nm·min-1)Effective etching diameter/mm
      1053.51.47318.88.4
      85.62.38325.411.1
      127.13.02330.616.3
      167.33.10352.820.0
    • Table 2. Modified optimization results

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      Table 2. Modified optimization results

      Optimization timesResidual peak to valley/nmResidual RMS/nmTotal residence time/min
      1184.712.66587.2
      2137.511.74539.3
      3119.811.51542.4
    • Table 3. Simulation results of ion beam polishing of diaphragm at different apertures

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      Table 3. Simulation results of ion beam polishing of diaphragm at different apertures

      Aperture/mmOptimal superimposed distance/mmMinimum residual peak-to-valley/nmRoot mean square/nmTotal residence time/min
      161.5σ16119.8011.50542.40
      121.5σ12108.589.66630.70
      81.4σ887.568.23744.53
      51.4σ576.424.631136.82
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    Le Kang, Shilei Jiang, Guobin Sun, Yuhao Zhang, Weiguo Liu. Simulation Study on Ion Beam Polishing with Changing Aperture by Diaphragm Method[J]. Laser & Optoelectronics Progress, 2021, 58(8): 0810016

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    Paper Information

    Category: Image Processing

    Received: Aug. 7, 2020

    Accepted: Sep. 14, 2020

    Published Online: Apr. 16, 2021

    The Author Email: Shilei Jiang (jiangshilei8@163.com)

    DOI:10.3788/LOP202158.0810016

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