Laser & Infrared, Volume. 55, Issue 4, 562(2025)

Implementation method of correlated double sampling for infrared readout circuit based on CTIA

DING Jian-hua1,2 and YUAN Yuan2
Author Affiliations
  • 1School of Integrated Circuits, Shandong University, Jinan 250000, China
  • 2North China Research Institute of Electro-Optics, Beijing 100015, China
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    References(4)

    [3] [3] Blerkom D A V. Analysis and simulation of CTIA-based pixel reset noise[J]. Infrared Technology and Applications XXXVII, 2011, 8012: 159-168.

    [4] [4] Johnson J F, Lomheim T S. Focal-plane signal and noise model-CTIA ROIC[J]. IEEE Transactions on Electron Devices, 2009, 56(11): 2506-2515.

    [11] [11] Goto M, Honda Y, Watabe T, et al. In-pixel A/D converters with 120-dB dynamic range using event-driven correlated double sampling for stacked SOI image sensors[C]//2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S). IEEE, 2016: 1-3.

    [12] [12] W Zhu, et al. A high-sensitivity and large-dynamic range readout circuit for polysilicon-based microbolometer[C]//2023 China Semiconductor Technology International Conference (CSTIC). IEEE, 2023: 1-3.

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    DING Jian-hua, YUAN Yuan. Implementation method of correlated double sampling for infrared readout circuit based on CTIA[J]. Laser & Infrared, 2025, 55(4): 562

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    Paper Information

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    Received: Jul. 9, 2024

    Accepted: May. 29, 2025

    Published Online: May. 29, 2025

    The Author Email:

    DOI:10.3969/j.issn.1001-5078.2025.04.012

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