The readout circuit is a key component of infrared detector components, and the noise has a significant impact on signal readout and the performance of the imaging system. Noise is inevitable during signal transmission, but noise performance can be optimized by noise reduction techniques and reasonable design. In this paper, starting from analyzing the noise in the readout circuit of infrared detectors, two correlated dual sampling techniques are compared based on CTIA input-level simulation: pixel-level correlated dual sampling and column-level correlated dual sampling. The aim is to select a more suitable correlated dual sampling based on the requirements and characteristics of different infrared detectors to reduce the reset noise, MOSFET noise, FPN noise of the readout circuit, and while taking into account the requirements of dynamic range, linearity, and power consumption.