[1] [1] Zhang Jianmin, Zhang Zhen, Feng Guobin, et al. Estimating method of jamming thresholds for laser irradiated interline tranfer CCD［J］. Acta Optica Sinica, 2015, 35(3): 0314004.

[2] [2] Liu Yi, Zhou Qing, Yin Dayi. Analysis andsolution of two-phase FT-CCD charge overflow phenomenon［J］. Laser & Optoelectronics Progress, 2014, 51(8): 080401.

[3] [3] Li Z W, Wang X, Shen Z H, et al. Mechanisms for the millisecond laser-induced functional damage to silicon charge-coupled imaging sensors［J］. Applied Optics, 2015, 54(3): 378-388.

[4] [4] Li M X, Jin G Y, Tan Y, et al. Study on the mechanism of a charge-coupled device detector irradiated by millisecond pulse laser under functional loss［J］. Applied Optics, 2016, 55(6): 1257-1261.

[5] [5] Ni Xiaowu, Lu Jian, He Anzhi. Measurement of laser damaging thresholds of CCD devices［J］. Laser Technology, 1994, 18(3): 153-156.

[6] [6] Shen Hongbin, Shen Xueju, Zhou Bing, et al. Experimental study of 532 nm pulsed laser irradiating CCD［J］. High Power Laser and Particle Beams, 2009, 21(10): 1449-1454.

[7] [7] Shao Junfeng, Liu Yang, Wang Tingfeng, et al. Damage effect of charge coupled device with multiple-pulse picosecond laser［J］. Acta Armamentarii, 2014, 35(9): 1408-1413.

[8] [8] Gao L Z, Zhu Z W, Shao Z Z, et al. Electric-induced oxide breakdown of a charge-coupled device under femtosecond laser irradiation［J］. Applied Optics, 2013, 52(31): 7524-7529.

[9] [9] Huang Shaoyan, Zhang Yongsheng, Tang Benqi, et al. Damage effect on CCD detector irradiated by 500 fs laser pulse［J］. High Power Laser and Particle Beams, 2005, 17(10): 1445-1448.

[10] [10] Qiu Dongdong, Zhang zhen, Wang Rui, et al. Mechanism research of pulsed-laser induced damage to CCD imaging devices［J］. Acta Optica Sinica, 2011, 31(2): 0214006.

[11] [11] Jiang Nan, Zhang Chu, Niu Yanxiong, et al. Numerical simulation of pulsed laser induced damage on CCD arrays［J］. Laser and Infrared, 2008, 38(10): 1004-1007.

[12] [12] Zhao Q Z, Qiu J R, Jiang X W, et al. Direct writing computer-generated holograms on metal film by an infrared femtosecond laser［J］. Optics Express, 2005, 13(6): 2089-2092.