Laser & Optoelectronics Progress, Volume. 57, Issue 21, 212302(2020)

Nanometer Gap Measurement Based on Metal-Cladding Waveguide Configurations

Xiao Pingping*, Wang Fei, and Deng Manlan
Author Affiliations
  • 宜春学院物理科学与工程技术学院电子信息工程系, 江西 宜春 336000
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    Figures & Tables(6)
    Schematic of sensing structure
    Relationship between κ0h0 and effective refractive index for symmetrical metal-cladding waveguide structure
    Relation between reflectivity and incident angle under different air gap thicknesses without organic film
    Simulated R-θ curves when air gap thickness is 0 nm and 100 nm, respectively
    Relationship between air gap thickness and corresponding resonance angle
    Relationship between air gap thickness in the range of 0--10 nm with corresponding resonance angle
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    Xiao Pingping, Wang Fei, Deng Manlan. Nanometer Gap Measurement Based on Metal-Cladding Waveguide Configurations[J]. Laser & Optoelectronics Progress, 2020, 57(21): 212302

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    Paper Information

    Category: Optical Devices

    Received: Nov. 1, 2019

    Accepted: --

    Published Online: Oct. 24, 2020

    The Author Email: Xiao Pingping (xpp7967@163.com)

    DOI:10.3788/LOP57.212302

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