Optical Properties and the Minimal Continuous Thickness of Molybdenum Nano-Films

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Chinese Journal of Lasers, Volume. 32, Issue 7, 977(2005)

[in Chinese]^1,2,3、*, [in Chinese]¹, [in Chinese]¹, [in Chinese]^1,2, and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

³[in Chinese]

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References(7)

[2] [2] D. N. Jarrett, L. Ward. Optical properties of discontinuous gold films [J]. J. Phys. D: Appl. Phys., 1976, 9: 1515～1527

[3] [3] R. H. Doremus. Optical properties of thin metallic films in island form [J]. J. Appl. Phys., 1966, 37(7): 2775～2781

[5] [5] Shouhua Shi, Zhuoliang Cao, Zhaoqi Sun. Microstructure and Raman spectra of Ag-MgF2 cermet films [J]. Chin. Opt. Lett., 2003, 1(5): 305～307

[6] [6] Zhaoqi Sun, Daming Sun. Optical constants and their dispersion of Ag-MgF2 nanoparticle composite films [J]. Chin. Opt. Lett., 2004, 2(4): 243～245

[12] [12] Shi Xu, B. L. Evans, D. I. Flynn et al.. The study of island growth of ion beam sputtered metal films by digital image processing [J]. Thin Solid Films, 1994, 238: 54～61

[13] [13] B. L. Evans, Shi Xu. The nucleation and growth of thin films [C]. SPIE, 1990, 1324: 90～102

[14] [14] Shi Xu, B. L. Evans. Nucleation and growth of ion beam sputtered metal films [J]. J. Mat. Sci., 1992, 27: 3108～3117

CLP Journals

[1] Xilian Sun, Ruijin Hong, Haihong Hou, Zhengxiu Fan, Jianda Shao, "Optical properties and structures of silver thin films deposited by magnetron sputtering with different thicknesses," Chin. Opt. Lett. 4, 366 (2006)

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Optical Properties and the Minimal Continuous Thickness of Molybdenum Nano-Films[J]. Chinese Journal of Lasers, 2005, 32(7): 977

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Paper Information

Category: materials and thin films

Received: Aug. 12, 2004

Accepted: --

Published Online: Jun. 1, 2006

The Author Email: (fanping@szu.edu.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology