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Chinese Optics Letters, Volume. 13, Issue Suppl., S23401(2015)

Development of a XEOL detection system for the scanning transmission X-ray microscopy beamline at the Shanghai Synchrotron Radiation Facility

Huaina Yu1, Zhenhua Chen1, Xiangyu Meng1, Yong Wang1、*, Ying Zou1、**, Renzhong Tai1、***, Yuting Nie2, and Xuhui Sun2
Author Affiliations
  • 1Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China
  • 2Institute of Functional Nano and Soft Materials (FUNSOM) and Jiangsu Key Laboratory for Carbon-Based Functional Materials and Devices, Soochow University, Suzhou 215123, China
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    Cited By

    [1] Chi Zhang, Haigang Liu, Chunpeng Wang, Zhi Guo, Xiangzhi Zhang, Zijian Xu, Xiangjun Zhen, Yong Wang, Renzhong Tai. Automatic Feedback System for X-ray Flux at BL08U1A Soft X-ray Spectromicroscopy Beamline of Shanghai Synchrotron Radiation Facility. Applied Sciences, 13, 5456(2023).

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    Huaina Yu, Zhenhua Chen, Xiangyu Meng, Yong Wang, Ying Zou, Renzhong Tai, Yuting Nie, Xuhui Sun, "Development of a XEOL detection system for the scanning transmission X-ray microscopy beamline at the Shanghai Synchrotron Radiation Facility," Chin. Opt. Lett. 13, S23401 (2015)

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    Paper Information

    Category: X-ray Optics

    Received: Apr. 30, 2015

    Accepted: Jul. 9, 2015

    Published Online: Aug. 8, 2018

    The Author Email: Yong Wang (wangyong@sinap.ac.cn), Ying Zou (zouying@sinap.ac.cn), Renzhong Tai (tairenzhong@sinap.ac.cn)

    DOI:10.3788/COL201513.S23401

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology