Infrared and Laser Engineering, Volume. 46, Issue 10, 1003002(2017)
Damage accumulation effects of multiple laser pulses irradiated on charged coupled device
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Shao Junfeng, Guo Jin, Wang Tingfeng, Zheng Changbin. Damage accumulation effects of multiple laser pulses irradiated on charged coupled device[J]. Infrared and Laser Engineering, 2017, 46(10): 1003002
Paper Information
Category: 特约专栏-野光电器件激光辐照效应冶
Received: Aug. 10, 2017
Accepted: Sep. 23, 2017
Published Online: Nov. 27, 2017
The Author Email: Junfeng Shao (13159754836@163.com)
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