Researching | Optical System Design for Multi-Spectral Laser Radar with Refraction and Reflection in Co-Path

Chinese Journal of Lasers, Volume. 45, Issue 5, 510008(2018)

Optical System Design for Multi-Spectral Laser Radar with Refraction and Reflection in Co-Path

Li Jing^1,2, Che Ying^1、*, Wang Jiaan¹, Jin Meishan², and Luan Shuang²

Author Affiliations

¹[in Chinese]

²[in Chinese]

show less

Abstract Get PDF(in Chinese)

Figures&Tables (10)

References (16)

Paper Information

Figures & Tables(10)

Fig. 1. Laser transmitter system

Download full size

Fig. 2. Wave aberration of laser ablation system

Download full size

Fig. 3. Visible light receiving system

Download full size

Fig. 4. Monochrome echo receiving system

Download full size

Fig. 5. MTF of visible light receiving system

Download full size

Fig. 6. Spot diagram of visible light receiving system

Download full size

Fig. 7. Radial energy of visible light receiving system

Download full size

Fig. 8. Radial energy of monochrome echo receiving system

Download full size

Fig. 9. System structure

Download full size

Table 1. Optical parameters of laser radar
View table
Table 1. Optical parameters of laser radar
Parameter Value
Wavelength /nm 400-1400
F 8
FOV in visible spectrumrange /(°) 1.6
Resolution /mrad 0.0135
Laser beam expanding ratio 12.6
Detection range/km >10

Tools

Get Citation

Copy Citation Text

Li Jing, Che Ying, Wang Jiaan, Jin Meishan, Luan Shuang. Optical System Design for Multi-Spectral Laser Radar with Refraction and Reflection in Co-Path[J]. Chinese Journal of Lasers, 2018, 45(5): 510008

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: remote sensing and sensor

Received: Nov. 3, 2017

Accepted: --

Published Online: May. 21, 2018

The Author Email: Ying Che (cheying@cust.edu.cn)

DOI:10.3788/CJL201845.0510008

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology