Photonics Research, Volume. 10, Issue 10, 2328(2022)
Compact nano-void spectrometer based on a stable engineered scattering system
Fig. 1. Production of pseudo-random scattering chips. (a) Femtosecond laser writing experimental setup for scattering medium. (b) Design of scattering planes: a regular grid of scattering voids (red dots) is randomized in either the
Fig. 2. (a) Scattering spectrometer setup. (b) Example of speckle intensity pattern captured with camera. (c) Inverse of normalized singular values before (red) and after (green) applying Wiener filter. The signal-to-noise ratio (SNR) of the system is set to 100. RCA is the reciprocal component amplitude.
Fig. 3. Cropping and binning effect on speckle stability. (a) Unmodified speckle time-wise displacement in
Fig. 4. Wavelength reconstruction stability test for (a) long-term fixed wavelength over 168 h (chip), (b) long-term fixed wavelength over 12 h (50 cm MMF), and (c) short-term wavelength steps over a total of 180 h, comparing the reconstructed and OSA-measured reference wavelengths (chip).
Fig. 5. (a) Reconstruction of a spectrum with two wavelengths separated by 0.1 nm. (b) Spectrum with sinusoidal shape (black), its ideal reconstruction from the calibration data (red), and its reconstruction from test speckle patterns (blue). (c) Impact of binning on reconstructed spectrum, showing an increase in standard deviation. (d) Impact of binning on reconstructed spectrum, showing reduction in spectral contrast.
Fig. 6. Impact of cropping and binning on spectral reconstruction. Spectrum matrices for (a) full image size, (b)
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Qi Sun, Przemyslaw Falak, Tom Vettenburg, Timothy Lee, David B. Phillips, Gilberto Brambilla, Martynas Beresna, "Compact nano-void spectrometer based on a stable engineered scattering system," Photonics Res. 10, 2328 (2022)
Category: Optical Devices
Received: May. 27, 2022
Accepted: Aug. 5, 2022
Published Online: Sep. 27, 2022
The Author Email: Martynas Beresna (M.Beresna@soton.ac.uk)