[3] [3] Lei Huang, Mourad Idir, Chao Zuo et al. Review of phase measuring deflectometry［J］. Optics and Lasers in Engineering,2018,107:247-257.

[4] [4] Kim C J. Polynomial fit of interferograms［J］. Applied Optics,1982,21(24): 4521-4525.

[5] [5] Shanyong Chen, Shuai Xue, Guilin Wang, et al. Subaperture stitching algorithms: A comparison［J］. Optics Communications,2017,390:61-71.

[8] [8] MC Knauer, J Kaminski, G Hausler. Phase measuring deflectometry: a new approach to measure specular free-form surfaces［C］∥ Conference on Optical Metrology in Production Engineering, Strasbourg, France:SPIE,2004,5457:366-376.

[14] [14] Graves L R, Quach H, Choi H, et al. Infinite deflectometry enabling 2π-steradian measurement range［J］. Optical Express,2019,27(5):7602-7615.

[16] [16] Besl P J, McKay N D. A method for registration of 3-D shapes［J］. IEEE Transactions on Pattern Analysis and Machine Intelligence,1992,14 (2),239-256.