Fig. 1. X-ray double crystal diffraction ω/(2θ) experimental results of samples 1 and 2 and fitting results of sample 1. (a) X-ray double-crystal diffraction ω/(2θ) scanning experimental results and fitting results of sample 1; (b) enlarged images of satellite diffraction peaks of sample 1 and sample 2 [full width at half maximum (FWHM) of satellite diffraction peaks is marked in arc second]

Fig. 2. Structural model of sample device and structure of actual fabricated device. (a) 2D schematic diagram of device structure;(b) structure of sample 1 under high magnification optical microscope

Fig. 3. P-I-V curves of sample 1 and sample 2 in CW mode and spectra higher than threshold. (a) P-I-V curves of coated devices with different growth stages at 283 K in CW mode; (b) spectra of samples 1 and 2 with currents slightly higher than threshold (inset is beam image of sample 1 in pulsed mode at room temperature)

Fig. 4. P-I-V curves of devices of sample 1 and sample 2 at different temperatures in CW mode. (a) P-I-V curves of sample 1 at different temperatures in CW mode; (b) P-I-V curves of sample 2 at different temperatures in CW mode