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Chinese Optics Letters, Volume. 14, Issue 8, 081201(2016)

Closely interleaved self-comparison method applied to precise measurement

Fan Zou1,2, Rong Wei1、*, Richang Dong1,2, Tingting Chen1,2, Wenli Wang1, and Yuzhu Wang1
Author Affiliations
  • 1Key Laboratory of Quantum Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    Fan Zou, Rong Wei, Richang Dong, Tingting Chen, Wenli Wang, Yuzhu Wang, "Closely interleaved self-comparison method applied to precise measurement," Chin. Opt. Lett. 14, 081201 (2016)

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Feb. 18, 2016

    Accepted: May. 24, 2016

    Published Online: Aug. 3, 2018

    The Author Email: Rong Wei (weirong@siom.ac.cn)

    DOI:10.3788/COL201614.081201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology