Chinese Journal of Lasers, Volume. 43, Issue 12, 1205001(2016)
Beam Alignment and Convergence Analysis of Scanning Beam Interference Lithography Systems
Article index updated: Mar. 10, 2025
Get Citation
Copy Citation Text
Wang Wei, Bayanheshig, Song Ying, Jiang Shan, Pan Mingzhong. Beam Alignment and Convergence Analysis of Scanning Beam Interference Lithography Systems[J]. Chinese Journal of Lasers, 2016, 43(12): 1205001
Category: beam transmission and control
Received: Aug. 16, 2016
Accepted: --
Published Online: Dec. 9, 2016
The Author Email: Wei Wang (wayne_lzu@163.com)