Chinese Journal of Lasers, Volume. 37, Issue S1, 239(2010)
Fast Nondestructive Testing by Terahertz Wave
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Pan Rui, He Ting, Xiong Wei, Shen Jingling. Fast Nondestructive Testing by Terahertz Wave[J]. Chinese Journal of Lasers, 2010, 37(S1): 239
Paper Information
Category: Measurement and metrology
Received: Apr. 20, 2010
Accepted: --
Published Online: Oct. 29, 2010
The Author Email: Rui Pan (peter_pan211@139.com)
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