Influence of surface roughness on surface plasmon resonance phenomenon of gold film

Zhitao Yang; Changjian Liu; Yachen Gao; Jiyu Wang; Wenlong Yang

doi:10.3788/COL201614.042401

Chinese Optics Letters, Volume. 14, Issue 4, 042401(2016)

Influence of surface roughness on surface plasmon resonance phenomenon of gold film

Zhitao Yang^1,2、*, Changjian Liu², Yachen Gao^1,3、**, Jiyu Wang², and Wenlong Yang²

¹Postdoctoral Mobile Research Station of the School of Electronic Engineering, Heilongjiang University, Harbin 150080, China

²School of Applied Sciences, Harbin University of Science and Technology, Harbin 150080, China

³Key Laboratory of Electronics Engineering, College of Heilongjiang Province, Heilongjiang University, Harbin 150080, China

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Fig. 1. Configuration of the angle-modulation SPR measurement.

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Fig. 2. Reflection Intensity of small-angle x ray scattering from the gold film.

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Fig. 3. Surface morphology images of samples detected by AFM.

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Fig. 4. SPR measurement of samples with different surface roughness.

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Fig. 5. Data of resonance angle versus RMS-roughness and the results of the fitting.

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Table 1. Results of Surface RMS-Roughness and SPR of Samples
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Table 1. Results of Surface RMS-Roughness and SPR of Samples
Sample Annealing temperature (°C) RMS- roughness (nm) Resonance angle (°) Resonance depth
1 100 1.260 44.04 0.0976
2 200 0.906 43.94 0.0935
3 300 0.700 43.75 0.0947
4 400 0.415 43.65 0.1160

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Zhitao Yang, Changjian Liu, Yachen Gao, Jiyu Wang, Wenlong Yang, "Influence of surface roughness on surface plasmon resonance phenomenon of gold film," Chin. Opt. Lett. 14, 042401 (2016)

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