Chinese Journal of Lasers, Volume. 31, Issue 8, 911(2004)

Grating External Cavity Semiconductor Laser Used in Interference Measurement

[in Chinese]1、* and [in Chinese]2
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  • 2[in Chinese]
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    [in Chinese], [in Chinese]. Grating External Cavity Semiconductor Laser Used in Interference Measurement[J]. Chinese Journal of Lasers, 2004, 31(8): 911

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    Paper Information

    Category: Laser physics

    Received: Aug. 18, 2003

    Accepted: --

    Published Online: Jun. 12, 2006

    The Author Email: (zwrjule@yahoo.com.cn)

    DOI:

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