Acta Optica Sinica, Volume. 45, Issue 8, 0812001(2025)

Multi-Magnification Topographic Data Fusion Method Based on White Light Microscopic Interferometry

Shucheng Xu, Qun Yuan*, Xiaoxin Fan, Jiale Zhang, Yicen Ma, Chen Ding, Zhenyan Guo, and Zhishan Gao
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu, China
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    Figures & Tables(12)
    Fusion strategy flowchart
    Registration flowchart
    Three-dimensional representation of normalized cross correlation coefficient
    Measuring tilted surfaces with interferometric microscopes. (a) Small NA; (b) large NA
    Decomposition levels
    Data fusion workflow fiagram of convex microlens array
    Profile curves of convex microlen. (a) X-direction; (b) Y-direction
    Data measured by SEM. (a) Local; (b) large field of view
    Data fusion workflow fiagram of cylindrical microlens array
    • Table 1. Interferometric lens parameters

      View table

      Table 1. Interferometric lens parameters

      MagnificationNAfs /μm-1Resolution /μmFOV /mmθmax /(°)
      0.130.4832.7361.41×1.417.470
      10×0.301.1151.1850.71×0.7117.458
      20×0.401.4870.8890.35×0.3523.578
      50×0.552.0450.6470.14×0.1433.367
      100×0.702.6020.5080.07×0.0744.427
    • Table 2. Fusion strategy

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      Table 2. Fusion strategy

      fS0, 1/6S1/6, 1/3S1/3, 1/2S1/2, 2/3S2/3, 5/6S5/6, 1
      f1q1q1q1q1q1q1
      f2q2p2q2p2q2p2q2p2q2p2q2p2
      f3p3p3q3p3q3p3q3p3p3
      f4p4p4p4p4q4p4
      f5p5p5p5p5p5
      f6p6p6p6p6p6
      f7p7
      f8p8
      f9p9
    • Table 3. Measurement data

      View table

      Table 3. Measurement data

      MethodPeriod /μmHeight/mmRadius of curvature /mm
      X-directionY-direction
      510.6002.74211.53011.417
      20×2.57512.48712.447
      Fusion496.1102.67112.32312.167
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    Shucheng Xu, Qun Yuan, Xiaoxin Fan, Jiale Zhang, Yicen Ma, Chen Ding, Zhenyan Guo, Zhishan Gao. Multi-Magnification Topographic Data Fusion Method Based on White Light Microscopic Interferometry[J]. Acta Optica Sinica, 2025, 45(8): 0812001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 23, 2024

    Accepted: Feb. 10, 2025

    Published Online: Apr. 15, 2025

    The Author Email: Qun Yuan (yuanqun@njust.edu.cn)

    DOI:10.3788/AOS241918

    CSTR:32393.14.AOS241918

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