Unconventional Photon Blockade Under the Combined Effects of Second-Order Nonlinearity and Two-Photon Absorption Environment

Fig. 1. Variation in natural logarithm of the equal-time second-order correlation function $g^{(2)} (0)$ with the detuning and the second-order nonlinearity interaction strength coefficient. (a) Variation in natural logarithm of $g^{(2)} (0)$ with $Δ_{A} / κ_{A}$ and $G / κ_{A}$ , where $Δ_{B} / κ_{A} = 2.0$ ; (b) variation in natural logarithm of $g^{(2)} (0)$ with $Δ_{B} / κ_{A}$ and $G / κ_{A}$ , where $Δ_{A} / κ_{A} = 1.0$

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Fig. 2. Variation in natural logarithm of the equal-time second-order correlation function $g^{(2)} (0)$ with the driving strengths and the second-order nonlinearity interaction strength coefficient. (a) Variation in natural logarithm of $g^{(2)} (0)$ with $F_{A} / κ_{A}$ and $G / κ_{A}$ , where $F_{B} / κ_{A} = 0.01$ ; (b) variation in natural logarithm of $g^{(2)} (0)$ with $F_{B} / κ_{A}$ and $G / κ_{A}$ , where $F_{A} / κ_{A} = 0.01$

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Fig. 3. Variation in natural logarithm of the equal-time second-order correlation function $g^{(2)} (0)$ with the second-order nonlinearity interaction strength coefficient under different driving strengths

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Fig. 4. Variation in natural logarithm of the equal-time second-order correlation function $g^{(2)} (0)$ with the driving strengths under different second-order nonlinearity interaction strengths

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Fig. 5. Schematic diagram of the system energy-level and the photon transition path

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Zhiqiang Zhang. Unconventional Photon Blockade Under the Combined Effects of Second-Order Nonlinearity and Two-Photon Absorption Environment[J]. Laser & Optoelectronics Progress, 2025, 62(7): 0719001

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Paper Information

Category: Nonlinear Optics

Received: Oct. 14, 2024

Accepted: Dec. 25, 2024

Published Online: Mar. 17, 2025

The Author Email: Zhiqiang Zhang (zhangzhiqiang08@gmail.com)

DOI:10.3788/LOP242095

CSTR:32186.14.LOP242095

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology