Chinese Journal of Lasers, Volume. 43, Issue 3, 302002(2016)

Analysis of Near-Field Modulations Caused by Defects in High Power Laser System

You Kewei1,2、*, Zhang Yanli1, Zhang Xuejie1, Zhang Junyong1, and Zhu Jianqiang1
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  • 2[in Chinese]
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    You Kewei, Zhang Yanli, Zhang Xuejie, Zhang Junyong, Zhu Jianqiang. Analysis of Near-Field Modulations Caused by Defects in High Power Laser System[J]. Chinese Journal of Lasers, 2016, 43(3): 302002

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    Paper Information

    Category: Laser physics

    Received: Sep. 21, 2015

    Accepted: --

    Published Online: Mar. 4, 2016

    The Author Email: Kewei You (you.ke.wei@siom.ac.cn)

    DOI:10.3788/cjl201643.0302002

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