Chinese Journal of Lasers, Volume. 43, Issue 3, 302002(2016)
Analysis of Near-Field Modulations Caused by Defects in High Power Laser System
In high power laser device, near- field beam quality is evaluated through the intensity distribution. However, the measured distribution is a steady state, which can not reflect the evolution features of intensity modulation caused by noise disturbances. Some area encountering serious intensity modulation may be ignored in transmission process. Near-field transmission characteristics of the beam disturbed by noise disturbance are studied. Meanwhile, deeper understanding of the limitations of the measured near-field intensity distribution is obtained. To simplify the analysis of the near-field intensity distribution at different distance under the influence of single local defect, the characteristics of near-field intensity modulation is represented by equivalent Fresnel number. The results show that once a weak modulated information appears in the distribution of measured nearfield intensity, there may be a more serious modulation area before the measurement position. A highest modulation can be up to nine times for a phase type defects with π delay corresponding to incident intensity.
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You Kewei, Zhang Yanli, Zhang Xuejie, Zhang Junyong, Zhu Jianqiang. Analysis of Near-Field Modulations Caused by Defects in High Power Laser System[J]. Chinese Journal of Lasers, 2016, 43(3): 302002
Category: Laser physics
Received: Sep. 21, 2015
Accepted: --
Published Online: Mar. 4, 2016
The Author Email: Kewei You (you.ke.wei@siom.ac.cn)