Chinese Journal of Lasers, Volume. 43, Issue 3, 302002(2016)

Analysis of Near-Field Modulations Caused by Defects in High Power Laser System

You Kewei1,2、*, Zhang Yanli1, Zhang Xuejie1, Zhang Junyong1, and Zhu Jianqiang1
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  • 1[in Chinese]
  • 2[in Chinese]
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    In high power laser device, near- field beam quality is evaluated through the intensity distribution. However, the measured distribution is a steady state, which can not reflect the evolution features of intensity modulation caused by noise disturbances. Some area encountering serious intensity modulation may be ignored in transmission process. Near-field transmission characteristics of the beam disturbed by noise disturbance are studied. Meanwhile, deeper understanding of the limitations of the measured near-field intensity distribution is obtained. To simplify the analysis of the near-field intensity distribution at different distance under the influence of single local defect, the characteristics of near-field intensity modulation is represented by equivalent Fresnel number. The results show that once a weak modulated information appears in the distribution of measured nearfield intensity, there may be a more serious modulation area before the measurement position. A highest modulation can be up to nine times for a phase type defects with π delay corresponding to incident intensity.

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    You Kewei, Zhang Yanli, Zhang Xuejie, Zhang Junyong, Zhu Jianqiang. Analysis of Near-Field Modulations Caused by Defects in High Power Laser System[J]. Chinese Journal of Lasers, 2016, 43(3): 302002

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    Paper Information

    Category: Laser physics

    Received: Sep. 21, 2015

    Accepted: --

    Published Online: Mar. 4, 2016

    The Author Email: Kewei You (you.ke.wei@siom.ac.cn)

    DOI:10.3788/cjl201643.0302002

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