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Spectroscopy and Spectral Analysis, Volume. 38, Issue 1, 82(2018)

Raman and IR Study on Silicon Films at Transition Regime

FAN Shan-shan1,2、*, GUO Qiang3, YANG Yan-bin3, CONG Ri-dong3, YU Wei3, and FU Guang-sheng1,3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    FAN Shan-shan, GUO Qiang, YANG Yan-bin, CONG Ri-dong, YU Wei, FU Guang-sheng. Raman and IR Study on Silicon Films at Transition Regime[J]. Spectroscopy and Spectral Analysis, 2018, 38(1): 82

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    Paper Information

    Received: Sep. 10, 2017

    Accepted: --

    Published Online: Jan. 30, 2018

    The Author Email: Shan-shan FAN (fanss1981@126.com)

    DOI:10.3964/j.issn.1000-0593(2018)01-0082-05

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology