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Chinese Optics Letters, Volume. 19, Issue 3, 030005(2021)

Stable and high performance all-inorganic perovskite light-emitting diodes with anti-solvent treatment Editors' Pick

Sajid Hussain1, Ahmad Raza1, Fawad Saeed1, Abida Perveen1, Yan Sikhai1, Nasrud Din1, Elias E. Elemike2, Qianqian Huang1, Alagesan Subramanian1、*, Qasim Khan1,3、**, and Wei Lei1、***
Author Affiliations
  • 1Joint International Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, China
  • 2Chemistry Department, North West University, Mafikeng, South Africa
  • 3Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen 518000, China
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    [2] Shunfa Gong, Ruirui Wu, Sen Yang, Lifang Wu, Minmin Zhang, Qiuju Han, Wenzhi Wu, "Tuning the luminous properties and optical thermometry of Cs2SnCl6 phosphor microcrystals via Bi and Sb codoping," Photonics Res. 9, 2182 (2021)

    Cited By

    [1] Sajid Hussain, Fawad Saeed, Ahmad Raza, Abida Parveen, Ali Asghar, Nasrud Din, Zhang Chao, Jing Chen, Qasim Khan, Wei Lei. Highly Stable Inverted CdSe/ZnS-Based Light-Emitting Diodes by Nonvacuum Technique ZTO as the Electron-Transport Layer. Electronics, 10, 2290(2021).

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    Sajid Hussain, Ahmad Raza, Fawad Saeed, Abida Perveen, Yan Sikhai, Nasrud Din, Elias E. Elemike, Qianqian Huang, Alagesan Subramanian, Qasim Khan, Wei Lei, "Stable and high performance all-inorganic perovskite light-emitting diodes with anti-solvent treatment," Chin. Opt. Lett. 19, 030005 (2021)

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    Paper Information

    Category: Special Issue on Metal Halide Perovskite and Their Applications

    Received: Dec. 8, 2020

    Accepted: Jan. 19, 2021

    Published Online: Mar. 11, 2021

    The Author Email: Alagesan Subramanian (alaphy007@hotmail.com), Qasim Khan (qasim@szu.edu.cn), Wei Lei (lw@seu.edu.cn)

    DOI:10.3788/COL202119.030005

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology