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Acta Optica Sinica, Volume. 21, Issue 7, 825(2001)

Quantum Analysis and Measurement for Transient Spectrum

[in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]2
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    [3] [3] Richard L L. Photoelectronic Imaging Devices. New York: Plenum Press, 1971. 66～80

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Quantum Analysis and Measurement for Transient Spectrum[J]. Acta Optica Sinica, 2001, 21(7): 825

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    Paper Information

    Category: Spectroscopy

    Received: Mar. 13, 2000

    Accepted: --

    Published Online: Aug. 10, 2006

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology