Measurement of the Homogeneity of Refractive Index of the Germanium Crystal Using IR Interferometer

[in Chinese]; [in Chinese]; [in Chinese]

Chinese Journal of Lasers, Volume. 32, Issue 3, 404(2005)

[in Chinese]^*, [in Chinese], and [in Chinese]

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References(4)

[1] [1] R. E. Gaskin, C. Lewis. Interferometric measurements of refractive index variations in infrared transmitting material at 10.6 μm [J]. Optics Acta, 1980, 27(9): 1287～1294

[2] [2] Charles E. Synborski, Mary J. Hanes. 10.6 micron wavelength interferometry and the measurement of infrared transmitting materials index of refraction homogeneity [C]. SPIE, 1980, 255:32～39

[3] [3] B. Dichler, P. Koidl. Scanning CO2 laser interferometer for the inspection of infrared transmitting plane parallel plate [C]. SPIE, 1988, 966:177～182

[4] [4] Chen Jinbang, Song Dezhen, Zhu Rihong et al.. Large aperture-high accuracy phase shifting digital flat interferometer [J]. Opt. Eng., 1996, 35(7):1936～1942

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[in Chinese], [in Chinese], [in Chinese]. Measurement of the Homogeneity of Refractive Index of the Germanium Crystal Using IR Interferometer[J]. Chinese Journal of Lasers, 2005, 32(3): 404

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Paper Information

Category: Measurement and metrology

Received: Oct. 5, 2003

Accepted: --

Published Online: Jun. 1, 2006

The Author Email: (chenlei@mail.njust.edu.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology