Measurement of microscopic surface topography of alloy dimple fracture by scanning white-light interferometry

[1] [1] AZEVEDO C R F, MARQUES E R. Three-dimensional analysis of fracture, corrosion and wear surfaces［J］. Engineering Failure Analysis, 2010, 17: 286-300.

[2] [2] VENKATESH B, CHEN D L, BHOLE S D. Three-dimensional fractal analysis of fracture surfaces in a titanium alloy for biomedical applications［J］. Scripta Materialia, 2008, 59: 391-394.

[3] [3] STAMP J, SCHERER S, GRUBER M, et al.. Reconstruction of surface topographies by scanning electron microscopy for application in fracture research［J］. J. Appl. Phys., 1996, 63: 341-346.

[4] [4] NICHOLS A B, LANGE D A. 3D surface image analysis for fracture modeling of cement-based materials［J］. Cement and Concrete Research, 2006, 36: 1098-1107.

[5] [5] HOROVISTIZ A L, FRADE J R, HEIN L R O. Comparison of fracture surface and plane section analysis for ceramic grain size characterization［J］. Journal of the European Ceramic Society, 2004, 24: 619-626.

[6] [6] ZOU W D, DU N, XIAO H R, et al.. A white-light system for inspecting and measuring endface topography of fiber connector［C］. Proceedings of ISTM 2005, Volume 1: 983-986.

[7] [7] FABIEN S, PAUL C M, DENIS M, et al.. Teager-Kaiser energy and higher-order operators in white-light interference microscopy for surface shape measurement［J］. EURASIP Journal on Applied Signal Processing, 2005, 17: 2804-2815.

[8] [8] JEREMY C, JON P, FENG G, et al.. Limitations of white light interferometry［R］. http: //www.npl.co.uk/engineering/the-limitations-of-white-light-interferometry.

[9] [9] ZOU W D, DU N, FU Y J, et al.. A fast-fourier-transform algorithm for surface profiler based on scanning white-light interferometry［C］. Proceedings of ICO-20, 2005: 0403-0416.

[10] [10] PETER D G, LESLIE D. Surface profiling by analysis of white-light interferograms in the spatial frequency domain［J］. J. mod. Opt, 1995, 42(2): 389-401.

[11] [11] LEE B S, STRAND T C. Profilometry with a coherence scanning microscope［J］. 1990, Appl. Opt, 29: 3784-3788.

[12] [12] PETER D G, LESLIE D. Three-dimensional imaging by sub-Nyquist sampling of white-light interferograms［J］. Optics Letters, 1993, 18(17): 1462-1464.

CLP Journals

[1] Ma Long, Lü Yi, Pei Xin, Jiao Zhichao, Zhang Hongyan, Hu Yanmin. Adaptive Planning Method of Spatial Scanning Range for White Light Interferometric Profiler[J]. Laser & Optoelectronics Progress, 2017, 54(6): 61202

[2] WANG Daijun, CHEN Chungen, ZHU Lihua, ZOU Wendong. Three-dimensional Denoising of White-light Interferograms[J]. Opto-Electronic Engineering, 2015, 42(3): 60

[3] Dong Yifan, Wan Xinjun, Meng Han, Xie Shuping. Fast and Stable White Light Interferometry[J]. Laser & Optoelectronics Progress, 2017, 54(5): 51203

[4] YANG Meng-sheng, XING Pi-feng, WEI Cheng-fu, TANG Jie, LI Chao-yang. Precision diffusion bonding of iron-aluminum impedance match target[J]. Optics and Precision Engineering, 2016, 24(11): 2738

[5] ZOU Wen-dong, LIU Jia, WANG Xing-xing, JIANG Mao-qing, GONG Yong-qing. Measurement and fabrication error analysis of FZP core mould[J]. Optics and Precision Engineering, 2013, 21(5): 1160

[6] JIANG Dagang, YANG Yuanhong, QIN Kaiyu. A Zero OPD Location Algorithm for WLI Based on the Symmetry Criterion[J]. Opto-Electronic Engineering, 2013, 40(10): 1

Tools

Get Citation

Copy Citation Text

ZOU Wen-dong, HUANG Chang-hui, ZHENG Qiang, XU Zhou-jue, DONG Na. Measurement of microscopic surface topography of alloy dimple fracture by scanning white-light interferometry[J]. Optics and Precision Engineering, 2011, 19(7): 1612

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category:

Received: Sep. 26, 2010

Accepted: --

Published Online: Aug. 15, 2011

The Author Email: ZOU Wen-dong (18979106189@189.cn)

DOI:10.3788/ope.20111907.1612

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology