Research on Scattering in the THz Quantitative Analysis

LI Zhi; LIAN Fei-yu

doi:10.3964/j.issn.1000-0593(2016)06-1666-04

Spectroscopy and Spectral Analysis, Volume. 36, Issue 6, 1666(2016)

Research on Scattering in the THz Quantitative Analysis

LI Zhi^1,2 and LIAN Fei-yu^1,2

Author Affiliations

¹[in Chinese]

²[in Chinese]

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References(8)

[1] [1] Busch S F, Weidenbach M, Fey M, et al. Journal of Infrared Millimeter and Terahertz Waves, 2014, 35(12): 993.

[2] [2] Neumaier P F X, Schmalz K, Borngraeber J, et al. Analyst, 2015, 140(1): 213.

[3] [3] Bawuah P, Silfsten P, Ervasti T, et al. International Journal of Pharmaceutics, 2014, 476(1-2): 16.

[4] [4] Reid C B, Reese G, Gibson A P, et al. IEEE Transactions on Terahertz Science and Technology, 2013, 3(4): 363.

[7] [7] Spangenberg B, Poole C F, Weins C. Quantitative Thin-Layer Chromatography: a Practical Survey. Berlin: Springer Verlag Berlin Heideberg, 2011.

[8] [8] Franz M, Fischer B M, Walther M. Applied Physics Letters, 2008, 92: 021107.

[9] [9] Kaushik M, Ng B W H, Fischer B M, et al. Applied Physics Letters, 2012, 100: 011107.

[10] [10] Schecklman S, Zurk L M, Henry S, et al. Journal of Applied Physics, 2011, 109: 094902.

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LI Zhi, LIAN Fei-yu. Research on Scattering in the THz Quantitative Analysis[J]. Spectroscopy and Spectral Analysis, 2016, 36(6): 1666

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Paper Information

Received: Mar. 11, 2015

Accepted: --

Published Online: Dec. 20, 2016

The Author Email:

DOI:10.3964/j.issn.1000-0593(2016)06-1666-04

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology