Chinese Journal of Lasers, Volume. 52, Issue 1, 0104003(2025)
Design, Fabrication, and Testing of Integrated Reflective Vapor Cell for Chip-Scale Atomic Clocks
Fig. 3. Single-step process for atomic cell. (a) Wet etching of Si; (b) etching angle of 45°; (c) microscopic distribution of alkali metals in MEMS gas chamber;
Fig. 4. Overall process flow of alkali metal MEMS vapor chamber. (a) Preparation of Si; (b) wet etching; (c) deposition of aluminum; (d) first anodic bonding; (e) pipetting and drying; (f) evaperation; (g) second anodic bounding
Fig. 5. Schematic diagram of circuit structure for measuring frequency stability and internal diagram of physical system. (a) Schematic diagram of circuit structure; (b) internal diagram of physical system
Fig. 6. Alkali metal MEMS vapor chamber test. (a) Atomic vapor cell containing 6 mm optical length cavity; (b) test fixture for testing alkali metal atomic vapor cell; (c) frequency stability of MEMS vapor cell
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Taolong Wang. Design, Fabrication, and Testing of Integrated Reflective Vapor Cell for Chip-Scale Atomic Clocks[J]. Chinese Journal of Lasers, 2025, 52(1): 0104003
Category: Measurement and metrology
Received: Aug. 1, 2024
Accepted: Sep. 4, 2024
Published Online: Jan. 14, 2025
The Author Email: Wang Taolong (wangtaolongnuc@163.com)
CSTR:32183.14.CJL241106