Laser & Optoelectronics Progress, Volume. 58, Issue 23, 2316004(2021)
Analysis of High-Resolution X-Ray Diffraction for InAs/GaSb Superlattice
Fig. 1. Structural diagrams of the first group of samples with the same thickness and different periods. (a) Sample 1; (b) sample 2
Fig. 2. Structural diagrams of the second group of samples with the same thickness and different periods. (a) Sample 3; (b) sample 4
Fig. 3. Simulation of samples. (a) Sample 1; (b) sample 2; (c) sample 3; (d) sample 4
Fig. 5. AFM morphologies of the first group of samples. (a) Sample 1; (b) sample 2
Fig. 7. AFM morphologies of the second group of samples. (a) Sample 3; (b) sample 4
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Qiang Zhang, Dan Fang, Xiaoyu Qi, Han Li. Analysis of High-Resolution X-Ray Diffraction for InAs/GaSb Superlattice[J]. Laser & Optoelectronics Progress, 2021, 58(23): 2316004
Category: Materials
Received: Jul. 30, 2021
Accepted: Sep. 8, 2021
Published Online: Nov. 19, 2021
The Author Email: Dan Fang (fangdan19822011@163.com)