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Acta Optica Sinica, Volume. 43, Issue 5, 0511001(2023)

High-Precision Static Aberration Correction Method of SPGD Algorithm

Meirui Chen1, Lü Jiang2, Hongmin Mao1, Huijuan Sun3, Jiantao Peng4, Guoding Xu1, Lifa Hu2, Huanjun Lu1、*, and Zhaoliang Cao1、**
Author Affiliations
  • 1Jiangsu Key Laboratory of Micro and Nano Heat Fluid Flow Technology and Energy Application, School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou 215009, Jiangsu, China
  • 2School of Science, Jiangnan University, Wuxi 214122, Jiangsu, China
  • 3Institute of Mathematics and Physics, Beijing Union University, Beijing 100101, China
  • 4Shanghai Institute of Satellite Engineering, China Aerospace Science and Technology Corporation, Shanghai 201109, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (20)
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    References (25)
    Cited By (4)
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    Figures & Tables(20)
    Optical path for static aberration correction

    Fig. 1. Optical path for static aberration correction

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    Flow chart of SPGD algorithm

    Fig. 2. Flow chart of SPGD algorithm

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    Scheme of performance metrics combination method

    Fig. 3. Scheme of performance metrics combination method

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    Flow chart of performance metrics combination method

    Fig. 4. Flow chart of performance metrics combination method

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    Simulated results of distorted image. (a) First 36 Zernike coefficients; (b) distorted wavefront; (c) far-field intensity distribution

    Fig. 5. Simulated results of distorted image. (a) First 36 Zernike coefficients; (b) distorted wavefront; (c) far-field intensity distribution

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    Far-field intensity distributions after EE correction. (a) DEE=0.5d; (b) DEE=d; (c) DEE=1.5d; (d) DEE=2d; (e) DEE=2.5d; (f) DEE=3d

    Fig. 6. Far-field intensity distributions after EE correction. (a) DEE=0.5d; (b) DEE=d; (c) DEE=1.5d; (d) DEE=2d; (e) DEE=2.5d; (f) DEE=3d

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    Intensity distributions of horizontal centerline of target surface. (a) DEE=0.5d; (b) DEE=d; (c) DEE=1.5d; (d) DEE=2d; (e) DEE=2.5d; (f) DEE=3d

    Fig. 7. Intensity distributions of horizontal centerline of target surface. (a) DEE=0.5d; (b) DEE=d; (c) DEE=1.5d; (d) DEE=2d; (e) DEE=2.5d; (f) DEE=3d

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    Relationship between corrected SR and encircled diameter

    Fig. 8. Relationship between corrected SR and encircled diameter

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    Correction results for MR. (a) Convergence curve; (b) residual wavefront; (c) far-field intensity distribution

    Fig. 9. Correction results for MR. (a) Convergence curve; (b) residual wavefront; (c) far-field intensity distribution

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    Corrected results of MR method for 10 times repetition. (a) SR; (b) RMS of residual wavefront

    Fig. 10. Corrected results of MR method for 10 times repetition. (a) SR; (b) RMS of residual wavefront

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    Performance metric convergence curve of combination method

    Fig. 11. Performance metric convergence curve of combination method

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    Comparison of simulation correction results. (a)-(c) Residual wavefront; (d)-(f) far-field intensity distributions; (g)-(i) intensity distributions of horizontal centerline of target surface

    Fig. 12. Comparison of simulation correction results. (a)-(c) Residual wavefront; (d)-(f) far-field intensity distributions; (g)-(i) intensity distributions of horizontal centerline of target surface

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    Comparison of different noise simulation correction results. (a)-(d) Weak noise with gray level of 80; (e)-(h) strong noise with gray level of 1200

    Fig. 13. Comparison of different noise simulation correction results. (a)-(d) Weak noise with gray level of 80; (e)-(h) strong noise with gray level of 1200

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    Correction results of EE, MR, and performance index combination method for different noises

    Fig. 14. Correction results of EE, MR, and performance index combination method for different noises

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    Correction results of EE method and performance index combination method for different encircled diameters. (a) SR; (b) RMS of residual wavefront

    Fig. 15. Correction results of EE method and performance index combination method for different encircled diameters. (a) SR; (b) RMS of residual wavefront

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    Correction results of multiple random static aberrations. (a) SR; (b) RMS of residual wavefront

    Fig. 16. Correction results of multiple random static aberrations. (a) SR; (b) RMS of residual wavefront

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    Optical path of static aberration correction system

    Fig. 17. Optical path of static aberration correction system

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    Experimental results of static aberration correction. (a)-(d) Images of point object; (e)-(h) intensity distributions in center line of images

    Fig. 18. Experimental results of static aberration correction. (a)-(d) Images of point object; (e)-(h) intensity distributions in center line of images

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    Performance metric convergence curves. (a) EE method; (b) MR method; (c) performance metric combination method

    Fig. 19. Performance metric convergence curves. (a) EE method; (b) MR method; (c) performance metric combination method

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    • Table 1. Parameters in simulation

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      Table 1. Parameters in simulation

      ParameterTelescope aperture DT /cm

      Focal length

      f /m

      		Wavelength λ /nm

      Pixel size

      s /μm

      Value2066333.3
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    Meirui Chen, Lü Jiang, Hongmin Mao, Huijuan Sun, Jiantao Peng, Guoding Xu, Lifa Hu, Huanjun Lu, Zhaoliang Cao. High-Precision Static Aberration Correction Method of SPGD Algorithm[J]. Acta Optica Sinica, 2023, 43(5): 0511001

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    Paper Information

    Category: Imaging Systems

    Received: Aug. 12, 2022

    Accepted: Oct. 10, 2022

    Published Online: Feb. 27, 2023

    The Author Email: Lu Huanjun (caozl@usts.edu.cn), Cao Zhaoliang (luhuanjun@usts.edu.cn)

    DOI:10.3788/AOS221604

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology