[2] [2] Anna T, Dubey S K, Shakher C,et al. Sinusoidal fringe projection system based on compact and non-mechanical scanning low-coherence Michelson interferometer for three-dimensional shape measurement［J］. Optics Communications, 2009, 282（7）: 1237-1242.

[3] [3] Zhang J, Zhou C, Wang X. Three-dimensional profilometry using a Dammann grating［J］. Applied Optics, 2009, 48（19）: 3709-3715.

[4] [4] Yee S R, Griffin P M. Three-dimensional imaging system［J］. Optical Engineering, 1994, 33（6）: 2070-2076.

[5] [5] Da F, Gai S. Flexible three-dimensional measurement technique based on a digital light processing projector［J］. Applied Optics, 2008, 47（3）: 377-385.

[6] [6] Zhang Z, Towers C E, Towers D P. Time efficient color fringe projection system for 3D shape and color using optimum 3-frequency selection［J］. Optics Express, 2006, 14（14）: 6444-6455.

[9] [9] Feng S, Chen Q, Zuo C,et al. Fast three-dimensional measurements for dynamic scenes with shiny surfaces［J］. Optics Communications, 2017, 382: 18-27.

[10] [10] Feng S, Zhang Y, Chen Q,et al. General solution for high dynamic range three-dimensional shape measurement using the fringe projection technique［J］. Optics and Lasers in Engineering, 2014, 59: 56-71.

[11] [11] Li D, Kofman J. Adaptive fringe-pattern projection for image saturation avoidance in 3D surface-shape measurement［J］. Optics Express, 2014, 22（8）: 9887-9901.

[12] [12] Halioua M, Liu H C. Optical three-dimensional sensing by phase measuring profilometry［J］. Optics and Lasers in Engineering, 1989, 11（3）: 185-215.

[13] [13] Liu K, Hua W, Wei J,et al. Divide and conquer: high-accuracy and real-time 3D reconstruction of static objects using multiple-phase-shifted structured light illumination［J］. Optics Express, 2020, 28（5）: 6995-7007.

[14] [14] Zuo C, Feng S, Huang L,et al. Phase shifting algorithms for fringe projection profilometry: A review［J］. Optics and Lasers in Engineering, 2018, 109: 23-59.

[18] [18] Songlin Chen, Renbo Xia, Jibin Zhao. Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system［J］. Optical Engineering, 2017, 56（3）: 033102.