Researching | Progress in Weak-Value-Based Quantum Metrology and Tomography

Laser & Optoelectronics Progress, Volume. 58, Issue 10, 1011004(2021)

Progress in Weak-Value-Based Quantum Metrology and Tomography

Liang Xu and Lijian Zhang^*

Author Affiliations

National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, Collaborative Innovation Center of Advanced Microstructures, and College of Engineering and Applied Sciences, Nanjing University, Nanjing, Jiangsu 210093, China

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Liang Xu, Lijian Zhang. Progress in Weak-Value-Based Quantum Metrology and Tomography[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011004

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Paper Information

Category: Imaging Systems

Received: Apr. 8, 2021

Accepted: Apr. 23, 2021

Published Online: May. 28, 2021

The Author Email: Lijian Zhang (lijian.zhang@nju.edu.cn)

DOI:10.3788/LOP202158.1011004

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology