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Acta Optica Sinica, Volume. 34, Issue 3, 312006(2014)

Refractive Index Distribution and Surface Profile Measurement of Micro-Optics Based on Dual Wavelength Digital Holography

Deng Lijun1、*, Yang Yong1, Shi Bingchuan1, Ma Zhonghong1, Ge Qi2, and Zhai Hongchen1
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    Article index updated: Mar. 10, 2025

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    Deng Lijun, Yang Yong, Shi Bingchuan, Ma Zhonghong, Ge Qi, Zhai Hongchen. Refractive Index Distribution and Surface Profile Measurement of Micro-Optics Based on Dual Wavelength Digital Holography[J]. Acta Optica Sinica, 2014, 34(3): 312006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 12, 2013

    Accepted: --

    Published Online: Feb. 28, 2014

    The Author Email: Lijun Deng (jxljdeng2008@163.com)

    DOI:10.3788/aos201434.0312006

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology