Laser & Optoelectronics Progress, Volume. 62, Issue 3, 0312008(2025)

Micro-Displacement Measurement System Based on Optical Fiber Mach-Zehnder Interferometry

Wen Pan1、*, Xiaojun Feng1, Xingyu Liu2, and Xiongxing Zhang2
Author Affiliations
  • 1Xi'an Modern Chemistry Research Institute, Xi'an 710065, Shaanxi , China
  • 2School of Opto-Electronical Engineering, Xi'an Technological University, Xi'an 710021, Shaanxi , China
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    References(22)

    [2] Li H T, Gao S, Zhao K et al. Application of non-contact vibration detection for gas insulated transmission line via laser doppler vibrometer technique[J]. Laser & Optoelectronics Progress, 61, 1312002(2024).

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    [4] Zhang B H, Yang J, Xie X J et al. Co2 gas pressure measurement based on laser interferometry[J]. Metrology & Measurement Technology, 41, 55-58(2021).

    [9] Wang D, Cui J J, Zhang F M et al. Review of Michelson laser interferometer for micro displacement measurement[J]. Acta Metrologica Sinica, 42, 1-8(2021).

    [10] Duan X Y, Ren D M. Review of high-resolution measuring method of displacement using laser interferometer[J]. Metrology & Measurement Technology, 32, 1-5, 13(2012).

    [13] Yang M, Cai C G, Wang Y et al. Review of acquisition and demodulation method of heterodyne interferometer signal[J]. Laser Journal, 39, 20-24(2018).

    [15] Xiao J, Liu B, Guo Y L et al. Signal processing of microwave interferometer based on Hilbert transform[J]. Journal of Detection & Control, 32, 80-83(2010).

    [17] Yang W L, Liu Y, He M Z et al. Study on signal crosstalk error and its compensation method in phase measurement for heterodyne interferometry[J]. Chinese Journal of Lasers, 50, 1004001(2023).

    [20] Hu J F, Li D M, Gu M X. Research on technology of interferometric fiber-optic hydrophone system based on heterodydne detection scheme[J]. Optics & Optoelectronic Technology, 17, 10-17(2019).

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    Wen Pan, Xiaojun Feng, Xingyu Liu, Xiongxing Zhang. Micro-Displacement Measurement System Based on Optical Fiber Mach-Zehnder Interferometry[J]. Laser & Optoelectronics Progress, 2025, 62(3): 0312008

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 29, 2024

    Accepted: Jun. 17, 2024

    Published Online: Feb. 10, 2025

    The Author Email:

    DOI:10.3788/LOP241192

    CSTR:32186.14.LOP241192

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