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Laser & Optoelectronics Progress, Volume. 56, Issue 8, 081402(2019)

Laser Linewidth Measurement at Fourier Limit Resolution

Huifang Hou1,2, Mingyong Jing1,2, Jianyong Hu1,2, Chengbing Qin1,2, Liantuan Xiao1,2、*, and Suotang Jia1,2
Author Affiliations
  • 1 State Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Laser Spectroscopy, Shanxi University, Taiyuan, Shanxi 0 30006, China
  • 2 Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, Shanxi 0 30006, China
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    Schematic of laser linewidth measurement based on time-resolved method

    Fig. 1. Schematic of laser linewidth measurement based on time-resolved method

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    Experiment setup of linewidth measurement at Fourier limit based on time-resolved method. (a) Experimental device of beat-frequency measurement; (b) optical path for producing coherent light field with linewidth of 10 Hz; (c) optical path of fiber laser

    Fig. 2. Experiment setup of linewidth measurement at Fourier limit based on time-resolved method. (a) Experimental device of beat-frequency measurement; (b) optical path for producing coherent light field with linewidth of 10 Hz; (c) optical path of fiber laser

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    Experimental results of linewidths of diode laser and fiber laser based on spectral analyzer and time-resolved method

    Fig. 3. Experimental results of linewidths of diode laser and fiber laser based on spectral analyzer and time-resolved method

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    Huifang Hou, Mingyong Jing, Jianyong Hu, Chengbing Qin, Liantuan Xiao, Suotang Jia. Laser Linewidth Measurement at Fourier Limit Resolution[J]. Laser & Optoelectronics Progress, 2019, 56(8): 081402

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Sep. 29, 2018

    Accepted: Nov. 22, 2018

    Published Online: Jul. 26, 2019

    The Author Email: Liantuan Xiao (xlt@sxu.edu.cn)

    DOI:10.3788/LOP56.081402

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology