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High Power Laser Science and Engineering, Volume. 9, Issue 2, 02000e22(2021)

1178 J, 527 nm near diffraction limited laser based on a complete closed-loop adaptive optics controlled off-axis multi-pass amplification laser system

Deen Wang1,2,3, Xin Zhang3, Wanjun Dai3, Ying Yang3, Xuewei Deng3, Lin Chen1,2,3, Xudong Xie3, Dongxia Hu3, Feng Jing3, Zeping Yang4, Qiang Yuan3, Xiaofeng Wei3, Qihua Zhu3, Wanguo Zheng3, Xiaomin Zhang3, and Lei Huang1,2、*
Author Affiliations
  • 1Key Laboratory of Photonic Control Technology (Tsinghua University), Ministry of Education, Beijing100084, China
  • 2State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing100084, China
  • 3Research Center of Laser Fusion, CAEP, Mianyang621900, China
  • 4Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu610209, China
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    Article index updated: Feb. 2, 2025

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 7 article(s) from Web of Science.
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Deen Wang, Xin Zhang, Wanjun Dai, Ying Yang, Xuewei Deng, Lin Chen, Xudong Xie, Dongxia Hu, Feng Jing, Zeping Yang, Qiang Yuan, Xiaofeng Wei, Qihua Zhu, Wanguo Zheng, Xiaomin Zhang, Lei Huang. 1178 J, 527 nm near diffraction limited laser based on a complete closed-loop adaptive optics controlled off-axis multi-pass amplification laser system[J]. High Power Laser Science and Engineering, 2021, 9(2): 02000e22

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    Paper Information

    Category: Research Articles

    Received: Jun. 13, 2020

    Accepted: Jan. 19, 2021

    Published Online: May. 24, 2021

    The Author Email: Lei Huang (hl@tsinghua.edu.cn)

    DOI:10.1017/hpl.2021.3

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology