Laser & Optoelectronics Progress, Volume. 51, Issue 8, 80401(2014)
Analysis and Solution of Two-Phase FT-CCD Charge Overflow Phenomenon
[1] [1] W F Kosonocky, J E Carnes, M G Kovac, et al.. Control of blooming in charge-couple imagers[J]. RCA Review, 1974, 35: 3-24.
[2] [2] Yasuo Ishihara, Eiji Oda, Hiroshi Tanigawa, et al.. Interline CCD image sensor with an antiblooming structure[J]. IEEE Transctions on Electron Devices, 1984, ED-31(1): 83-88.
[4] [4] Pierre Magnan. Detection of visible photons in CCD and CMOS: a comparative view[J]. Nuclear Instruments and Methods in Physics Research A: Acclerators, Spectrometers, Detectors and Associated Equipment, 2003, 504(1-3): 199-212.
[5] [5] Jaroslav Hynecek. Electron-Hole recombination antiblooming for virtual-phase CCD imager[J]. IEEE Transactions on Electron Devices, 1983, ED-30(8): 941-948.
[6] [6] Wu Lifan. Research on and simulation of a CCD image sensor with a vertical anti-blooming structure[J]. Electronic Science and Technology, 2010, 23(8): 18-19, 24.
[7] [7] Thomas W McCrunin, Larry C Schooley, Gary R Sims. Signal processing for low-light-level, high-precision CCD imaging[C]. SPIE, 1991, 1448: 225-236.
Get Citation
Copy Citation Text
Liu Yi, Zhou Qing, Yin Dayi. Analysis and Solution of Two-Phase FT-CCD Charge Overflow Phenomenon[J]. Laser & Optoelectronics Progress, 2014, 51(8): 80401
Category: Detectors
Received: Jan. 20, 2014
Accepted: --
Published Online: Jul. 30, 2014
The Author Email: Liu Yi (liuyi87@hotmail.com)