Laser & Optoelectronics Progress, Volume. 51, Issue 8, 80401(2014)

Analysis and Solution of Two-Phase FT-CCD Charge Overflow Phenomenon

Liu Yi1,2、*, Zhou Qing1,2, and Yin Dayi1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less

    Charge overflow phenomenon will arise when CCD is receiving strong signals. With CCD without overflow drains, the parameters of the imaging system have to be set properly to avoid charge overflow. Based on the charge overflow phenomenon when using HAMAMATSU Frame-Transfer CCD to image not so strong targets, according to the paper, it is caused by the long-time charge accumulation of the image section during line readout process. To remove the overflow signal effectively, multiple frame transfers are carried out before integration time. Integrating sphere tests are also performed to testify the reason and the solution.

    Tools

    Get Citation

    Copy Citation Text

    Liu Yi, Zhou Qing, Yin Dayi. Analysis and Solution of Two-Phase FT-CCD Charge Overflow Phenomenon[J]. Laser & Optoelectronics Progress, 2014, 51(8): 80401

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Detectors

    Received: Jan. 20, 2014

    Accepted: --

    Published Online: Jul. 30, 2014

    The Author Email: Liu Yi (liuyi87@hotmail.com)

    DOI:10.3788/lop51.080401

    Topics