Fig. 1. Plasma-grating-induced breakdown spectroscopy system. (a) Schematic of experimental setup; (b) schematic of spectrum acquisition timing

Fig. 2. Sample surface monitoring. (a) Schematic of monitoring principle; (b) CCD image of sample in overlapping area of two beams; (c) CCD image of sample outside overlapping area of two beams

Fig. 3. Spectral comparison between FIBS and GIBS systems

Fig. 4. Relationship between enhancement factor and inter-pulse delay

Fig. 5. Si I 288.2 nm spectral line intensity versus sample position in different systems. (a) FIBS system; (b) GIBS system

Fig. 6. Establishment of Cr element calibration curve in different systems. (a) FIBS system; (b) GIBS system