[1] [1] F. Chen, G. Brown, M. Song. Overview of three-dimensional shape measurement using optical methods［J］. Opt. Engng., 2000, 39(1): 10～22

[2] [2] S. S. Gorthi, P. Rastogi. Fringe projection techniques: Whither we are ［J］. Optics and Lasers in Engineering, 2010, 48(2): 133～140

[3] [3] V. Srinivasan, H. C. Liu, M. Halioua. Automated phase-measuring profilometry of 3-D diffuse objects［J］. Appl. Opt., 1984, 23(18): 3105～3108

[4] [4] S. Zhang. Recent progresses on real-time 3D shape measurement using digital fringe projection techniques［J］. Optics and Lasers in Engineering, 2010, 48(2): 149～158

[5] [5] Yue Huimin, Su Xianyu. Temporal phase unwrapping progress［J］. Laser Journal, 2004, 25(3): 9～12

[6] [6] D. C. Ghiglia, M. D. Pritt. Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software［M］. New York: Wiley, 1998

[7] [7] Yue Huimin. Research on Three-Dimensional Profilometry Based on Temporal Phase Unwrapping［D］. Chengdu: Sichuan University, 2005

[8] [8] K. Falaggis, D. P. Towers, C. E. Towers. Method of excess fractions with application to absolute distance metrology theoretical analysis［J］. Appl. Opt., 2011, 50(28): 5484～5498

[9] [9] J. M. Huntley, H. O. Saldner. Error-reduction methods for shape measurement by temporal phase unwrapping［J］. J. Opt. Soc. Am. A, 1997, 14(12): 3188～3196

[10] [10] J. Tian, X. Peng, X. Zhao. A generalized temporal phase unwrapping algorithm for three-dimensional profilometry［J］. Opt. and Lasers in Engineering, 2008, 46(4): 336～342

[11] [11] K. Houairi, F. Cassaing. Two-wavelength interferometry extended range and accurate optical path difference analytical estimator［J］. J. Opt. Soc. Am. A, 2009, 26(12): 2503～2511

[12] [12] C. E. Towers, D. P. Towers, J. D. C. Jones. Absolute fringe order calculation using optimised multi-frequency selection in full-field profilometry［J］. Optics and Lasers in Engineering, 2005, 43(7): 788～800

[13] [13] V. I. Gushov, Y. N. Solodkin. Automatic processing of fringe patterns in integer interferometers［J］. Optics and Lasers in Engineering, 1991, 14(4): 311～324

[14] [14] M. Takeda, Q. Gu, M. Kinoshita et al.. Frequency-multiplex Fourier-transform profilometry: a single-shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations［J］. Appl. Opt., 1997, 36(22): 5347～5354

[15] [15] J. Zhong, Y. Zhang. Absolute phase-measurement technique based on number theory in multifrequency grating projection profilometry［J］. Appl. Opt., 2001, 40(4): 492～500

[16] [16] C. Towers, D. Towers, J. Jones. Time efficient Chinese remainder theorem algorithm for full-field fringe phase analysis in multi-wavelength interferometry［J］. Opt. Express, 2004, 12(6): 1136～1143

[17] [17] X. G. Xia, G. Wang. Phase unwrapping and a robust Chinese remainder theorem［J］. IEEE Signal Processing Letters, 2007, 14(4): 247～250

[18] [18] W. Wang, X. G. Xia. A closed-form robust Chinese remainder theorem and its performance analysis［J］. IEEE Transactions on Signal Processing, 2010, 58(11): 5655～5666

[19] [19] J. Li, L. G. Hassebrook, C. Guan. Optimized two-frequency phase-measuring-profilometry light-sensor temporal-noise sensitivity［J］. J. Opt. Soc. Am. A, 2003, 20(1): 106～115

[20] [20] Zhang Xu, Zhu Limin. Phase error model from gamma distortion and Gamma Calibration［J］. Acta Optica Sinica, 2012, 32(4): 0413006

[21] [21] X. Zhang, L. M. Zhu, Y. F. Li. Indirect decoding edges for one-shot shape acquisition［J］. J. Opt. Soc. Am. A, 2011, 28(4): 651～661