Electro-Optic Technology Application, Volume. 40, Issue 2, 6(2025)

Design of Automatic Test System for High-speed Broadband Optical Network Parameters

CHEN Zhenwen1, SHENG Liwen1,2,3, ZHANG Aiguo1, JIN Hui1, LIU Zhiming1, and YIN Bingqi1
Author Affiliations
  • 1Ceyear Technologies Co., Ltd., Qingdao, China
  • 2Shandong Electronic Test & Measurement Technology Innovation Center, Qingdao, China
  • 3Science and Technology on Electronic Test & Measurement Laboratory, Qingdao, China
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    References(3)

    [1] [1] ABDALLAH Z, RUMEAU A, FERNANDEZ A, et al. Nonlinear equivalent-circuit modeling of a fast photodiode[J]. IEEE Photonics Technology Letters, 2014, 26(18): 1840-1842.

    [2] [2] BRANDL P, ZIMMERMANN H. Development of an optoelectronic integrated circuit for indoor optical wireless communication systems[J]. Transactions on Emerging Telecommunications Technologies, 2014, 25(6): 629-637.

    [19] [19] XIE S Y, ZHANG S Y, TAN C H. InGaAs/InAlAs avalanche photodiode with low dark current for high-speed operation[J]. IEEE Photonics Technology Letters, 2015, 27(16): 1745-1748.

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    CHEN Zhenwen, SHENG Liwen, ZHANG Aiguo, JIN Hui, LIU Zhiming, YIN Bingqi. Design of Automatic Test System for High-speed Broadband Optical Network Parameters[J]. Electro-Optic Technology Application, 2025, 40(2): 6

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    Paper Information

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    Received: Mar. 7, 2025

    Accepted: Jul. 2, 2025

    Published Online: Jul. 2, 2025

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