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Electro-Optic Technology Application, Volume. 39, Issue 3, 56(2024)

Research on Key Technology of High Speed Swept Testing System

QIAO Shan1, HAN Jilei1, ZHANG Shijie1, SHENG Liwen1,2,3, XU Chao1,2,3, and SHI Jiahui1
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  • 1[in Chinese]
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  • 3[in Chinese]
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    QIAO Shan, HAN Jilei, ZHANG Shijie, SHENG Liwen, XU Chao, SHI Jiahui. Research on Key Technology of High Speed Swept Testing System[J]. Electro-Optic Technology Application, 2024, 39(3): 56

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    Paper Information

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    Received: May. 6, 2024

    Accepted: --

    Published Online: Aug. 23, 2024

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    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology