Chinese Journal of Lasers, Volume. 44, Issue 10, 1002002(2017)

Submicron Fine Cutting-Surface of Sapphire Obtained by Chemical Corrosion Assisted Picosecond Laser Filamentation Technology

Yan Tianyang1、*, Ji Lingfei1, Li Lin1,2, Amina1, Wang Wenhao1, Lin Zhenyuan1, and Yang Qiang1
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    Figures & Tables(7)
    Filamentation traces in internal sapphire induced by picosecond laser irradiation
    Effects of picosecond laser peak power on (a) filamentation diameter and (b) filamentation length of sapphire
    Effect of laser focusing position on initial position of filamentation
    Effect of laser pulse number on filamentation diameter
    XRD spectra of (a) crude sapphire and (b) laser filamentation area
    Effect of overlap ratio of adjacent filamentation on roughness of sapphire cutting-surface
    Processing sample diagrams of sapphire. (a) Partial sapphire samples processed by laser filamentation cutting; (b) optical micrograph of the surface of crude sapphire edge (top) and cutting-surface of processed sample (bottom); (c) laser scanning confocal micrograph of cutting-surface of processed sample
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    Yan Tianyang, Ji Lingfei, Li Lin, Amina, Wang Wenhao, Lin Zhenyuan, Yang Qiang. Submicron Fine Cutting-Surface of Sapphire Obtained by Chemical Corrosion Assisted Picosecond Laser Filamentation Technology[J]. Chinese Journal of Lasers, 2017, 44(10): 1002002

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    Paper Information

    Category: laser manufacturing

    Received: Apr. 8, 2017

    Accepted: --

    Published Online: Oct. 18, 2017

    The Author Email: Tianyang Yan (yantianyang@emails.bjut.edu.cn)

    DOI:10.3788/CJL201744.1002002

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