Chinese Optics Letters, Volume. 8, Issue 1, 119(2010)

Evolution of stress in evaporated silicon dioxide thin films

Ming Fang1,2, Dafei Hu1,2, and Jianda Shao1
Author Affiliations
  • 1Key Laboratory of Material Science and Technology for High Power Lasers, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Graduate School of Chinese Academy of Sciences, Beijing 100049, China
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    CLP Journals

    [1] Guodong Liu, Binghui Lu, Heyi Sun, Bingguo Liu, Fengdong Chen, Zhitao Zhuang, "Improved phase-shifting diffraction interferometer for microsphere topography measurements," Chin. Opt. Lett. 14, 071202 (2016)

    [2] Hongji Qi, Meipin Zhu, Ming Fang, Shuying Shao, Chaoyang Wei, Kui Yi, and Jianda Shao. Development of high-power laser coatings[J]. High Power Laser Science and Engineering, 2013, 1(1): 01000036

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    Ming Fang, Dafei Hu, Jianda Shao, "Evolution of stress in evaporated silicon dioxide thin films," Chin. Opt. Lett. 8, 119 (2010)

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    Paper Information

    Received: Mar. 31, 2009

    Accepted: --

    Published Online: Mar. 1, 2010

    The Author Email:

    DOI:10.3788/COL20100801.0119

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