Chinese Optics Letters, Volume. 8, Issue 1, 119(2010)
Evolution of stress in evaporated silicon dioxide thin films
[1] [1] L. B. Freund and S. Suresh, Thin Film Materials: Stress,Defect Formation and Surface Evolution (Cambridge University Press, Cambridge, 2003).
[2] [2] Y. Chen, W. Zheng, W. Chen, S. He, and Y. Chen, Opt. Optoelectron. Technol. (in Chinese)3,(3)58 (2005).
[3] [3] S. Tamulevicius, Vacuum 51,127(1998).
[4] [4] J. A. Thornton, Thin Solid Films 54, 23(1978).
[5] [5] S. Y. Shao, J. D. Shao, H. B. He, and Z. X. Fan, Opt. Lett. 30, 2119 (2005).
[6] [6] Y. Shen, S. Shao, H. He, J. Shao, and Z. Fan, Chin. Opt. Lett. 5, S272 (2007).
[7] [7] Y. Wang, Y. G. Zhang, W. L. Chen, W. D. Shen, X. Liu, and P. F. Gu, Appl. Opt. 47,(13) C319 (2008).
[8] [8] H. Leplan, B. Geenen, J. Y. Robiic, and Y. Pauleau, J. Appl. Phys. 78, 962(1995).
[9] [9] Q. Xiao, H. He, S. Shao, J. Shao, and Z. Fan, Acta Opt. Sin. (in Chinese) 28, 1007(2008).
[10] [10] Q. Xiao, S. Shao, J. Shao, and Z. Fan, Chinese J. Lasers (in Chinese) 36, 1195 (2009).
[11] [11] H. Leplan, J. Y. Robic, and Y. Pauleau, J. Appl. Phys. 79, 6926 (1996).
[12] [12] J. A. Floro and E. Chason, Appl. Phys. Lett. 69, 3830 (1996).
[13] [13] C. Friesen and C. V. Thompson, Phys. Rev. Lett. 89,126103 (2002).
[14] [14] E. Chason, B. W. Sheldon, and L. B. Freund, Phys. Rev. Lett. 88, 156103 (2002).
[15] [15] A. L. Shull and F. Spaepen, J. Appl. Phys. 80, 6243(1996).
[16] [16] J. Thurn and R. F. Cook, J. Appl. Phys. 91, 1988 (2002).
[17] [17] E. H. Hirsch, J. Phys. D: Appl. Phys. 13, 2081 (1980).
[18] [18] A. E. Ennos, Appl. Opt. 5, 51 (1966).
[20] [20] Y. Pauleau, Vacuum 61, 175 (2001).
[21] [21] M. Fang, S. Shao, X. Shen, Z. Fan, and J. Shao, Acta Opt. Sin. (in Chinese) 29,1734 (2009).
[22] [22] S. Shao, "Study of the origin mechanism and controlling method of stress in thin films" PhD Thesis (Shanghai Institute of Optics and Fine Mechanics, Shanghai, 2005).
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Ming Fang, Dafei Hu, Jianda Shao, "Evolution of stress in evaporated silicon dioxide thin films," Chin. Opt. Lett. 8, 119 (2010)
Received: Mar. 31, 2009
Accepted: --
Published Online: Mar. 1, 2010
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