The field of view (FOV) and spatial resolution of conventional optical microscopes are mutually constrained, how to break through this limit, and how to simultaneously obtain high resolution and large FOV for high throughput imaging is one of the main research directions in the field of microscopy. Solving this scientific problem will help to accelerate scientific research, improve manufacturing capabilities, and provide new tools for medically assisted diagnosis. This paper introduces and compares five cutting-edge high-throughput microscopy techniques, including large-aperture objective fabrication and curved detectors, scanning stitching method, Fourier ptychographic microscopy (FPM), wide-field structured light illumination microscopy (SIM) and lens-free on-chip microscopy. The current status, challenge and future trends of high-throughput microscopy techniques are also analyzed and reported. The analysis points out that computational imaging is gradually becoming the main means of high-throughput microscopy, which breaks or bypasses the physical limit of optical microscopy and will open up a new era of high-throughput microscopy imaging.