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Chinese Optics Letters, Volume. 13, Issue 7, 071001(2015)

Femtosecond laser induced periodic large-scale surface structures on metals

Xiangming Dong... Haiying Song and Shibing Liu* |Show fewer author(s)
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  • Strong-Field and Ultrafast Photonics Lab, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
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    CLP Journals

    [1] Haiying Song, Shengwang Tan, Elshaimaa M. Emara, Yanjie Zhang, Shibing Liu, Yao Li, Haiyun Liu, "Effect of metal surface morphology on nano-structured patterns induced by a femtosecond laser pulse and its experimental verification," Chin. Opt. Lett. 16, 073202 (2018)

    [2] Haiying Song, Yanjie Zhang, Xiangming Dong, Shibing Liu, "Subwavelength ripple formation on planar and nonplanar surfaces by femtosecond laser scanning," Chin. Opt. Lett. 14, 123202 (2016)

    [3] Youwang Hu, Haoming Yue, Ji’an Duan, Cong Wang, Jianying Zhou, Yunpeng Lu, Kai Yin, Xinran Dong, Wenyi Su, Xiaoyan Sun, "Experimental research of laser-induced periodic surface structures in a typical liquid by a femtosecond laser," Chin. Opt. Lett. 15, 021404 (2017)

    [4] Bo Gao, Tao Chen, Vanthanh Khuat, Jinhai Si, Xun Hou, "Fabrication of grating structures on silicon carbide by femtosecond laser irradiation and wet etching," Chin. Opt. Lett. 14, 021407 (2016)

    Cited By

    [1] Xiong Shen, Peng Wang, Jun Liu, Takayoshi Kobayashi, Ruxin Li. Self-Referenced Spectral Interferometry for Femtosecond Pulse Characterization. Applied Sciences, 7, 407(2017).

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    Xiangming Dong, Haiying Song, Shibing Liu, "Femtosecond laser induced periodic large-scale surface structures on metals," Chin. Opt. Lett. 13, 071001 (2015)

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    Paper Information

    Category: Image processing

    Received: Mar. 19, 2015

    Accepted: Apr. 29, 2015

    Published Online: Sep. 14, 2018

    The Author Email: Shibing Liu (sbliu@bjut.edu.cn)

    DOI:10.3788/COL201513.071001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology