A method to evaluate the thermal resistance of a laser by wavelength hysteresis

Jie REN; Zhen ZHEN; Si-Yue JIN; Hai-Long HAN; Pu-Sheng YUAN; Ling-Yun LI; Li-Xing YOU; Zhen WANG; Xing-Sheng XU

doi:10.11972/j.issn.1001-9014.2023.03.013

Journal of Infrared and Millimeter Waves, Volume. 42, Issue 3, 377(2023)

A method to evaluate the thermal resistance of a laser by wavelength hysteresis

Jie REN^1,2, Zhen ZHEN^1,2, Si-Yue JIN^1,2, Hai-Long HAN^3,4, Pu-Sheng YUAN^3,4, Ling-Yun LI^3,4, Li-Xing YOU^3,4, Zhen WANG^3,4, and Xing-Sheng XU^1,2、*

Author Affiliations

¹State Key Laboratory of Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China

²Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

³State Key Lab of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology （SIMIT）, Chinese Academy of Sciences, Shanghai 200050, China

⁴CAS Center for Excellence in Superconducting Electronics （CENSE）, Shanghai 200050, China

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Figures & Tables(4)

Fig. 1. （a）The wiring diagram. A：Direct Current Source；B：Low-temperature Vacuum Chamber；C：Temperature Control Platform；D：Laser；E：Fiber Optic Spectrometer，（b）the power dissipation $P_{i n}$ changes with temperatures

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Fig. 2. The measurement interval is 10 minutes, (a) the central wavelength of the spectrum varies with ambient temperatures during the process of cooling and heating, (b) the results of curves fitted

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Fig. 3. The ratio of thermal resistance $R_{t h}$ during cooling to $R_{t h}$ during the heating process varying with the temperatures

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Fig. 4. The measurement interval is 120 minutes, (a) the central wavelength of the spectrum varies with temperatures, (b) the results of curves fitted

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Jie REN, Zhen ZHEN, Si-Yue JIN, Hai-Long HAN, Pu-Sheng YUAN, Ling-Yun LI, Li-Xing YOU, Zhen WANG, Xing-Sheng XU. A method to evaluate the thermal resistance of a laser by wavelength hysteresis[J]. Journal of Infrared and Millimeter Waves, 2023, 42(3): 377

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Paper Information

Category: Research Articles

Received: Oct. 29, 2022

Accepted: --

Published Online: Jul. 5, 2023

The Author Email: Xing-Sheng XU (xsxu@semi.ac.cn)

DOI:10.11972/j.issn.1001-9014.2023.03.013

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology